Memory self tests
Use this information to diagnose and resolve memory-self test errors.
Follow the suggested actions in the order in which they are listed in the Action column until the problem is solved.
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Error code | Description | Action |
210-000-000 | Passed the memory self test. | N/A |
201-811-xxx | Aborted the memory self test because the test was unable to locate the _SM_ key when locating the SMBIOS structure data. |
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201-812-xxx | Aborted the memory self test because the SMBIOS type 0 structure indicates a non-supported, invalid machine ID. |
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201-815-xxx | Aborted the memory self test because of a programming error in the Quick Memory menu item selection process. |
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201-818-xxx | Aborted the memory self test because the test was unable to locate the _SM_ key when locating the SMBIOS structure data for the memory information. |
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201-819-xxx | Aborted the memory self test because the START-END address ranges are located in the restricted area of memory. |
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201-877-xxx | Aborted the memory self test because the Mirroring feature is enabled. |
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201-878-xxx | Aborted the memory self test because the Sparing feature is enabled. |
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201-885-xxx | Aborted the memory self test because the microprocessor does not support MTRR functions and cannot de-cache available memory. |
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201-886-xxx | Aborted due to a program error in the E820 function call, which indicates there is not enough available memory for testing. |
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201-894-xxx | Aborted due to an unexpected error code. |
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201-899-xxx | The memory self test was aborted by the user. | The memory self test was terminated by the user before test completion. |
201-901-xxx | Failed the memory self test due to a single-bit error in DIMM x OR failed the memory self test due to a multi-bit error in DIMMs x and y. |
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