Memory self tests
Use this information to diagnose and resolve memory-self test errors.
Follow the suggested actions in the order in which they are listed in the Action column until the problem is solved.
| 
 | ||
|---|---|---|
| Error code | Description | Action | 
| 210-000-000 | Passed the memory self test. | N/A | 
| 201-811-xxx | Aborted the memory self test because the test was unable to locate the _SM_ key when locating the SMBIOS structure data. | 
 | 
| 201-812-xxx | Aborted the memory self test because the SMBIOS type 0 structure indicates a non-supported, invalid machine ID. | 
 | 
| 201-815-xxx | Aborted the memory self test because of a programming error in the Quick Memory menu item selection process. | 
 | 
| 201-818-xxx | Aborted the memory self test because the test was unable to locate the _SM_ key when locating the SMBIOS structure data for the memory information. | 
 | 
| 201-819-xxx | Aborted the memory self test because the START-END address ranges are located in the restricted area of memory. | 
 | 
| 201-855-xxx | Aborted the memory self test because there is no RSDT signature key in RSDT structure table in ACPI tables. | 
 | 
| 201-856-xxx | Aborted the memory self test because RSDT signature key is corrupt. | 
 | 
| 201-858-xxx | Aborted the memory self test because of invalid SRAT type. | 
 | 
| 201-877-xxx | Aborted the memory self test because the Mirroring feature is enabled. | 
 | 
| 201-878-xxx | Aborted the memory self test because the Sparing feature is enabled. | 
 | 
| 201-885-xxx | Aborted the memory self test because the microprocessor does not support MTRR functions and cannot de-cache available memory. | 
 | 
| 201-886-xxx | Aborted due to a program error in the E820 function call, which indicates there is not enough available memory for testing. | 
 | 
| 201-894-xxx | Aborted due to an unexpected error code. | 
 | 
| 201-899-xxx | The memory self test was aborted by the user. | The memory self test was terminated by the user before test completion. | 
| 201-901-xxx | Failed the memory self test due to a single-bit error in DIMM x OR failed the memory self test due to a multi-bit error in DIMMs x and y. | 
 | 
| 202-000-xxx | Passed the memory stress test. | N/A | 
| 202-801-xxx | Aborted the memory stress test due to an internal program error. | 
 | 
| 202-802-xxx | Failed the memory stress test due to insufficient available memory for testing. | 
 | 
| 202-901-xxx | Aborted the memory stress test due to an internal program error. | 
 | 
Give documentation feedback